Electric Field Mapping by Electro-Optical Probes in Known Geometries Under High Voltage

摘要

This paper reports the use of electro-optical (EO) probes in mapping electric field in known high voltage (HV) geometries (plane-plane and sphere-sphere). The measurements are performed autonomously with the use of a robotic arm and the development of an automatic data acquisition unit. The measured electric field profiles were then compared with finite element analysis (FEA) models calculated in COMSOL software and showed a good agreement with COMSOL. This work is part of the de-risking of non-contact electric field measurements for identifying defects on live cap and pin insulator strings on HV towers.