Control System of a Nanohandling Cell within a Scanning Electron Microscope
Marco Jähnisch, H. Hülsen, Torsten Sievers, Sergej Fatikow
- 发表年份
- 2005
- 引用次数
- 5
摘要
In this paper, current research towards an automated station handling micro- and nano-objects is presented. An experimental setup is shown in which two micro-robots are controlled. A client-server-based control system that integrates various actuators and sensors has been developed and tested. It has been adapted to work with sensor feedback from the main sensor, a scanning electron microscope (SEM). An estimation of the tilt angle of a 3 DoF rotational manipulator by vision sensor feedback is presented. Algorithms for real-time processing of noisy SEM-images have been designed and implemented. First investigations have been carried out for the extraction of depth information of objects and tools under the SEM, which is considered as being one main bottleneck problem for automated SEM-based nanohandling
关键词
相关论文
Statistical Learning Theory
Yuhai Wu, Vladimir Vapnik
1999
Artificial intelligence: a modern approach
1995
Applied Nonlinear Control
Jean-Jacques Slotine, Weiping Li
1991
A new optimizer using particle swarm theory
R.C. Eberhart, James Kennedy
2002