P. Sivaranjani
Papers
1
Total Citations
10
H-Index
1
About
P. Sivaranjani is a researcher specializing in computer vision and deep learning, with a particular focus on automated quality control systems. Her most cited work, "Scratch Detection in Cars Using Mask Region Convolution Neural Networks" (2020, 10 citations), addresses a critical challenge in the automotive manufacturing industry: the detection of cosmetic defects and surface imperfections in new vehicles before customer delivery. This research introduces a robust, machine vision-based system that leverages Mask R-CNN architecture to identify scratches and damages with high accuracy, replacing slower manual inspection processes. By developing this automated defect detection framework, Sivaranjani's work contributes to improving production efficiency and quality assurance in automotive assembly lines. Her research demonstrates the practical application of deep learning techniques to industrial quality control, showcasing how convolutional neural networks can be deployed for real-world manufacturing challenges. This work represents an important step toward fully automated visual inspection systems in the automotive sector.
Research Focus
Key Achievements
Top Papers
- 1Scratch Detection in Cars Using Mask Region Convolution Neural Networks10 citations · 2020