Profile measurements using multi-gray-scale pattern projection

Abstract

A novel optical profile measurement system has been developed using the multi-gray scale pattern projection. In the profile measurements, the time series space coding projection method is faster method than the slit projection method, the laser beam scanning method and so on. We applied the multi-gray scale (4 gray levels) fringe pattern and the image processing hardware on the time series space coding to reduce the number of projections and to speed up the measuring time. The series of tests show that the multi-gray scale projection sensor reliably ensures the 3-D profile of the machine parts as small as 0.2 mm in the measuring range 100 mm within 0.6 sec. It can be applied to measure 3-D profiles and 3-D environments for the moving robots.