Using Extended EM to Segment Planar Structures in 3D
Rolf Lakaemper, Longin Jan Latecki
- Year
- 2006
- Citations
- 19
Abstract
The proposed algorithm segments planar structures out of data gained from 3D laser range scanners, typically used in robotics. The approach first fits planar patches to the dataset, using a new, extended expectation maximization (EM) algorithm. This algorithm solves the classical EM problems of insufficient initialization by iteratively determining the number and positions of patches in a split and merge framework. Determining the fitting quality of the gained patches, the approach then allows for segmentation of planar surfaces out of the 3D environment. The result is a set of 2D objects, which can be used as input for classical computer vision applications, in particular for object recognition. Our approach makes it possible to apply classical tools of 2D image processing to solve problems of 3D robot mapping, e.g. landmark recognition
Keywords
Related papers
Statistical Learning Theory
Yuhai Wu, Vladimir Vapnik
1999
Artificial intelligence: a modern approach
1995
Applied Nonlinear Control
Jean-Jacques Slotine, Weiping Li
1991
A new optimizer using particle swarm theory
R.C. Eberhart, James Kennedy
2002