OTHER
Improved risk assessment model based on rough integrated clouds and ELECTRE-II method: an application to intelligent manufacturing process
Musavarah Sarwar, Wajeeha Gulzar, Samia Ashraf
- Year
- 2023
- Citations
- 25
Keywords
RandomnessVaguenessAmbiguityEntropy (arrow of time)ELECTREPairwise comparisonCloud computingRough setTOPSISComputer science
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