Home /Research /Ultrasonic phased array inspection of a Wire + Arc Additive Manufactured (WAAM) sample with intentionally embedded defects
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Ultrasonic phased array inspection of a Wire + Arc Additive Manufactured (WAAM) sample with intentionally embedded defects

Yashar Javadi, Charles MacLeod, Gareth Pierce, Anthony Gachagan, David Lines, Carmelo Mineo, Jialuo Ding, Stewart Williams, Momchil Vasilev, Ehsan Mohseni, Riliang Su

Year
2019
Citations
78

Keywords

Materials sciencePhased arrayUltrasonic sensorUltrasonic testingPhased array ultrasonicsCalibrationAcousticsSizingTransducerTungsten carbide

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