Optical tracking based EM-field probing system for EMC near field manual scanning

摘要

This paper introduces a method to visualize the frequency dependent electromagnetic field distribution on complex shaped electronic systems. This is achieved by combining magnetic field probing with an optical tracking system for automatically recording the probe position and orientation. Due to the complexity of the shape of the electronic systems of interest, and for utilizing the expertise of the user, the probe will be moved by manually instead of robotically. With the location from the optical tracking system, 3D near field strength map can be obtained at real time during near field manual scanning.