OTHER
An Automated Multi-Modal Serial Sectioning System for Characterization of Grain-Scale Microstructures in Engineering Materials
Michael D. Uchic, Michael A. Groeber, Megna Shah, Patrick G. Callahan, A. Shiveley, Michael J. Scott, Michael Chapman, Jonathan E. Spowart
- 发表年份
- 2012
- 引用次数
- 39
关键词
ModalElectron backscatter diffractionMaterials scienceCharacterization (materials science)Scanning electron microscopeScale (ratio)Data acquisitionMicrostructureComputer scienceEngineering
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