Proton Beam Testing of SEU Sensitivity of M430FR5989SRGCREP, EFM32GG11B820F2048, AT32UC3C0512C, and M2S010 Microcontrollers in Low-Earth Orbit

摘要

Proton beam testing was performed on several microcontrollers using proton energies between 2.4 MeV and 57.6 MeV. A remotely operated robotic testing platform was developed to improve testing throughput by minimizing the need for human intervention in the radiation vault. Sensitivity to SEU, SEL, and SEFI faults was determined. Using the measured SEU cross-section data along with NASA's radiation belt model, AP8, in-orbit SEU rates were determined for an ISS orbit. Testing was also done while varying the incidence angle of the proton beam which shows that the rate of SEL and SEFI faults increased significantly with shallower incidence angle.